2000

Best paper award for SCOBIC in International Symposium on Technical Failure Analysis 2000 (ISTFA)
2000 Improved sensitivity SEMICAPS Photon Emission Microscope System, SPEMS 1150P, was launched at Integrated Reliability Physics Symposium 2000 held in San Jose, CA, USA
2000 Improved Backside Imaging for the SPEMS 1150P

2001

Best paper in session for TBIP in International Symposium on Technical Failure Analysis 2000 (ISTFA)
2001 AMD won the Best Paper Award for the "Resistive Interconnect Localization" (RIL) technique, a technique that was developed with the SEMICAPS SOM 2000 system (ISTFA)

2002

Ethernet control imaging system SEMICAPS 2500
2002 AMD announced the "Soft Defect Localization" (SDL) technique in ISTFA 2002 with the SEMICAPS SOM 2000 system
2002 Tester docked SEMICAPS Scanning Optical Microscope, SOM 2000 , was launched at Integrated Reliability Physics Symposium 2002 held in Dallas, TX, USA

2004

SEMICAPS SOM 3000 was launched in TI Dallas

2007

Nanolab-Presto-SEMICAPS press release: Nanolab Technologies selects SEMICAPS SOM 4000 system for advanced optical fault localization services

2008

Presto press release: Presto Engineering and SEMICAPS Announce Strategic OEM Relationship

2008

Best Paper in session for Effect of Refractive Solid Immersion Lens Parameters on the Enhancement of Laser Induced Fault Localization Techniques (IPFA 2008)

2008

Best Paper in session for Near-Infrared Spectroscopic Photon Emission Microscopy of 0.13 m Silicon nMOSFETs and pMOSFETs (IPFA 2008)

2009

SEMICAPS LTP was launched.

2009

SEMICAPS 5000 was launched.

2009

NUS SEMICAPS received the President Technology Award from His Excellency, President SR Nathan on 28 September.