OPTICAL FAULT LOCALIZATION SYSTEM

SEMICAPS PEM
 
Liquid Crystal Option
A complimentary technique to PEM. Liquid crystal detects failures that
emit heat. By integrating LC with PEM, a wider range of failure modes
can be detected on a single platform

CAD Navigation option
Compatible with Knights CAD systems. Provides the ability to match the localized area of interest on the DUT to the CAD
layout Interface between SEMICAPS and CAD system via RS232 communication or Ethernet communication.

Spectroscopic option
Four ways of implementing spectroscopy

               

Using filter wheels
- Easy to implement
- Max ten filters. Ten points on spectrum, not continuous.
- Each filters do not have the same band-pass.
- Many steps to get a spectrum.
- Long acquisition time.
 

 

Using Mirror & Spectrometer
- Difficult to implement
- High collection efficiency (>80%)
- Continuous spectrum and high resolution
- Very short working distance not compatible with deep encapsulated package devices
 

              

Using Diffraction Grating
- Almost continuous spectrum
- Ease of acquisition
- See the whole spectrum accumulating at the same time
- Use higher order of diffraction
- Have Zero order spot
 

               Using Prism
- Almost continuous spectrum
- Ease of acquisition
- See the whole spectrum accumulating at the same time
- Non linear, requires calibration
- No Zero order spot
 

Probing Options: Manual, Automatic, Retrofit
SEMICAPS offers integration with commercially available probe stations for manual, semi-automatic, probe-card probing solutions and 200mm/300mm system.

Camera & Laser Scan Module Upgrade
The SEMICAPS PEM is fully upgradable to incorporate camera like InGaAs (TE-Cooled/LN2), Thermal Emission Camera and
NIR laser scan option with 1064nm or 1340nm source


                                                                                     
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